Navigation de collection par Auteur(e) Mohamed, Guellil
Montrant les résultats 1 à 2 de 2
Date de publication | Titre | Auteur(s) |
2014 | Challenges in the areal measurement of surface roughness and shape at the micro and nanoscale | PC, Montgomery; Mohamed, Guellil; P, Pfeiffer; B, Serio; F, Anstotz1; L, Pramatarova; S, Roques |
2014 | Comparison of areal measurements of the same zone of etched Si and hydroxyapatite layers on etched Si using different profiling techniques | Mohamed, Guellil; Paul C., Montgomery; Pierre, Pfeiffer; Bruno, Serio |