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Titre: Rietveld Refinement Using the Fullprof Program Some Special Application
Auteur(s): BENTAHAR, Fares
Mots-clés: X-ray diffraction ;
rietveld refinement ; the fullprof Suite
Date de publication: 2020
Editeur: université akli mohand oulhadj-bouira
Résumé: X-ray diffraction occupies an important place in materials science. Through this technique, it is easy to extract the cell parameters and identification of phases that exist in a crystalline sample. Nevertheless, when the phase is unknown, or in other words, if the sample contains a phase which does not exist in [kkk the] database then this makes the process of structural determination more difficult. It is due to this difficulty that the Rietveld method has gained fame in materials science in general and especially in the powder diffraction field. This work highlights, in some detail, the theoretical aspect of the Reitveld method. Also, the Fullprof program with its different commands is presented here. This investigation showcases special examples: a sample with a single phase of Y2O3 was prepared as powder, the second example is also a powder with triplet phases ZnO – Al2O3 – CaF2, and the third example is hematite and hematite-proto as a thin film sample
URI/URL: http://dspace.univ-bouira.dz:8080/jspui/handle/123456789/13998
Collection(s) :Mémoires Master

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